![](https://www.phgsc.me/wp-content/uploads/2018/10/Verios.png)
![](https://www.phgsc.me/wp-content/uploads/2018/10/Verios.png)
Precise SEM characterization of nanomaterials with sub-nanometer resolution and high material contrast.
The Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 keV energy range with excellent materials contrast. Unprecedented levels of automation and ease-of-use make this performance accessible to users of any experience level.