Malvern Panalytical
ThermoFisher Scientific
TED PELLA
Cryo-EM sample preparation tool with extended run time and enhanced…
Plasma focused ion beam scanning electron microscopy with multiple ion…
FIB SEM laser tool for high throughput millimeter scale cross…
Plasma focused ion beam scanning electron microscope for TEM sample…
FIB-SEM TEM sample preparation for the semiconductor industry, enabling full-wafer…
TEM analysis sample preparation workflow for automated, high throughput semiconductor…
Focused ion beam scanning electron microscope for ultra-high resolution, high-quality…
Sample preparation for TEM and STEM imaging or atom probe…
