Details
Many materials relevant for current and future applications are prone to beam damage. To generate meaningful data you need a system able to provide cutting edge results while maintaining sample integrity. The Spectra Ultra has been developed to tackle these challenges. The acceleration voltage can be switched rapidly to optimize imaging/spectroscopy conditions (high resolution available within 15 minutes after switching without specimen drift). The fastest and most sensitive EDS detector reduces exposure time. Advanced TEM and STEM detectors integrated in the Velox software are designed to simplify and speed up your path to the best results.
During this one-hour live demo, our TEM scientists will be demonstrating the Spectra Ultra from Thermo Fisher Scientific’s Nanoport in Eindhoven. You can expect to see:
- HR-STEM characterization of heavy and light elements via HAADF and iDPC STEM
- Sensitivity and acquisition speed of the Ultra X solution, enabled by a solid angle > 4 srad
- Live HT switch and operation of the microscope at lower kV including HR-STEM and EDS
- SW capabilities that simplify usage and reduce the time to data
Session details
Speakers (1)
