Plasma focused ion beam scanning electron microscopy with multiple ion species for 3D EM and TEM sample preparation.
The Thermo Scientific Helios 5 Hydra DualBeam (plasma focused ion beam scanning electron microscope, PFIB-SEM) can deliver four different ion species as the primary beam, allowing you to choose the ions that provide the best results for your samples and use cases, such as scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) sample preparation and 3D materials characterization.
You can switch easily between argon, nitrogen, oxygen, and xenon in under ten minutes without sacrifcing performance. This unprecedented flexibility significantly expands the potential application space of PFIB and enables research of ion-sample interactions to optimize existing use cases.
The Helios 5 Hydra DualBeam combines the new, innovative multi-ion-species plasma FIB (PFIB) column with the monochromated Thermo Scientific Elstar UC+ SEM Column to provide advanced focused ion- and electron-beam performance. Intuitive software and an unprecedented level of automation and ease-of-use allow observation and analysis of relevant subsurface volumes.